Tektronix SJ300E 622 Mb/s SDH/SONET Analyzer
SJ300E
Features
Generates and Measures Jitter on SDH/SONET Optical Inputs, up to 622 Mb/s
Measures Jitter Generation, Transfer and Tolerance
Stores and Executes Test Sequences for Jitter Tolerance and Transfer Testing
Detects and Records Jitter Hits
Generates and Measures Wander on 1.544 Mb/s and 2.048 MHz Synchronization Signals
Generates and Measures Jitter Up to 622 Mb/s
Wander Option (Opt. 06) Includes PC Software for Uploading, Calculating and Analyzing Wander Data
Data Correlation Method Used to Measure Jitter Transfer Provides Superior Accuracy
Measures and Generates Wander on SDH/SONET Lines
Tests Conformance to all ANSI, Bellcore and ITU-T Timing Standards CCITT G.958, CCITT G.703, ITU-T G.813 July 95, Bellcore GR-253-CORE (TR-NWT-000253), ANSI T1.101 and ANSI T1.120
RS-232 and GPIB Interfaces for Remote Operation
Real Time Wander Analysis and Display
Adapter Available for STSX-1 and STSX-3 (STM-1e) Analysis
Applications
Measure Jitter and Wander Generated and Tolerated by SDH/SONET Equipment and Clock-recovery ICs
Measure Jitter and Wander Transfer of SDH/SONET Equipment
Measure or Monitor Jitter and Wander at Line or Synchronization Interfaces
Generate and Analyze Line and Synchronization Phase Transients
SJ300E SDH/SONET Jitter and Wander Analyzer
Jitter and wander are causing increased concern in the industry. The SJ300E provides the assurance that your systems are operating properly. It enables manufacturers and service providers to verify proper operation and standards compliance of their products and networks. With its comprehensive measurements and associated analysis tools, the SJ300E is a complete solution.
Jitter and wander can cause severe problems in SDH and SONET systems. The SJ300E offers complete generation and measurement of phase jitter parameters on SDH/SONET signals up to 622 Mb/s. In addition, it generates and analyzes line and synchronization signal wander in SDH/SONET systems.
Network Test Capabilities
The SJ300E can also perform network wander tests. This includes sync transient generation, a choice of monitor or terminate levels for measuring sync signals and a wide choice of sync signal framing patterns. The wander test option (Opt. 06) includes software for fast analysis and graphical display of Time Deviation/Maximum Time Interval Error (TDEV/MTIE). This PC-based software drastically reduces the time and effort required to do wander analysis.
Jitter Generation,Transfer & Tolerance
Detects & Records Jitter Hits
Test Conformance to all ANSI,Bellcore
Real Time Wander Analysis & Display